Semiconductors
Inspection of semiconductors in quality assurance and in the case of failures creates a bottleneck in manufacturing. Powerave™ more than doubles throughput by eliminating the need to rotate optical lenses to change optical zoom. This automates zoom, thus allowing for easy integration of machine learning and artificial intelligence algorithms to prevent failures before they would otherwise be noticed. PoweRave™ Compact attaches to existing widefield microscopes at the objective turret and works with any brand. PoweRave™ Benchtop can be used at any infinite conjugate imaging location within a microscope. Both the compact and benchtop also work with cameras.